Rigaku's NEX QC SERIES of benchtop EDXRF (energy dispersive X-ray fluorescence) analyzers offers low cost analysis of solids, liquids, powders, alloys and thin films. Specifically designed for routine elemental analysis applications, the NEX QC analyzer is ideally suited for industrial at-line quality control applications. For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ delivers superior calibrations and precision for the most challenging measurements.

Features

• Analyze Na to U non-destructively
• Solids, liquids, alloys, powders and thin films
• 50 kV X-ray tube for wide elemental coverage
• Semiconductor detector for superior data quality
• Modern smartphone style "icon driven" user interface
• Multiple automated tube filters for enhanced sensitivity
• Convenient built in thermal printer
• Low cost with unmatched performance-to-price ratio

APPLICATION NOTES

The following application notes are relevant to this product

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ACZA wood treatment
Analysis of copper in ore
Analysis of S, Ni, V and Fe in residual oil
Ash content in coal
CCA wood treatment
Chlorine (Cl) and sulfur (S) in cement
Chromium conversion coating on aluminum
CuO wood treatment
Gold alloys
IPBC wood treatment
Iron (Fe) in aluminum (Al) metal
Iron (Fe) in ore materials
Iron in hay as a raw material for cattle feed
Iron oxide in silica sand
Lead (Pb) in gasoline per ASTM D5059
Lubricating oil by ASTM D6481
Manganese in Gasoline
Marine Fuel Analyzer
PENTA wood treatment
Phosphorus on fabric
Plating Baths
Silicone coating on paper and plastic
Silver (Ag) in barite ore
Sulfur (S) in gypsum
Sulfur in bunker fuel by ASTM D4294
Sulfur in coal
Sulfur in crude oil by ASTM D4294
Sulfur in diesel by ASTM D4294
Ti and Fe in kaolin clay
Ti conversion coating on aluminum (Al)
Zirconium on Aluminum Category by Benchtop EDXRF

Rigaku offers a state-of–the-art solution for your elemental analysis needs, with the NEX DE energy dispersive X-ray fluorescence spectrometer. The Rigaku NEX DE spectrometer delivers rapid quantitative determination of major and minor atomic elements, from sodium through uranium, in the widest possible variety of sample types — with or without standards.
 

XRF elemental analysis in the field, plant or lab

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.

Features

• Analyze Na to U non-destructively
• Powerful QuantEZ Windows^®-based software
• Solids, liquids, alloys, powders and thin films
• 60 kV X-ray tube for wide elemental coverage
• FAST SDD^® detector for superior counting statistics
• Multiple automated tube filters for enhanced sensitivity
• Unmatched performance-to-price ratio
• Optional RPF-SQX fundamental parameters software
• Optional standardless fundamental parameters software

APPLICATION NOTES

The following application notes are relevant to this product

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Additive Elements in Lubricating Oils - ASTM D7751
Air Filter Detection Limits
Analysis of Alloy Powders for Metal 3D Printing
Analysis of Carbon Black
Analysis of S, Ca, V, Fe, Ni in crude oil
Electrowinning gold processing
Finished Portland Cement
Gold & uranium in used ore material from ore dumps and tailing piles
Heavy metals in aerosols on air filters
Material Identification
Ni:Fe Metallurgy
Nuclear Power Station Cooling Water Filters
Organic Chlorides in Crude by ASTM D4929 Part C
Palladium Catalyst in Pharmaceuticals
Silver (Ag) and copper (Cu) in copper ore
Sulfur in ULSD by ISO13032

  Category by Benchtop EDXRF

Rigaku NEX CG II is a powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer for non-destructive elemental analysis of sodium to uranium in almost any matrix. The Rigaku NEX CG II pushes the boundaries of EDXRF technology with its unique close-coupled Cartesian Geometry (CG) optical kernel. NEX CG II serves a broad range of applications and industries and is an ideal tool for measuring ultra-low and trace element concentrations into percentage levels.
 

CARTESIAN GEOMETRY AND POLARIZATION FOR TRACE LEVEL SENSITIVITY

NEX CG II builds on NEX CG’s legacy of using Cartesian Geometry and secondary targets for trace-level sensitivity. NEX CG II features a unique and improved close-coupled Cartesian Geometry optical kernel that dramatically increases the signal-to-noise ratio and delivers enhanced elemental analysis.

Unlike conventional EDXRF spectrometers, NEX CG II is an indirect excitation system using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.

NEX CG II achieves this superior analytical power with a 50 kV 50 W end-window palladium-anode X-ray tube, five secondary targets covering the complete elemental range sodium through uranium (Na – U), and a high-throughput large-area silicon drift detector (SDD). This unique optical kernel, combined with Rigaku’s advanced RPF-SQX Fundamental Parameters software, delivers the most sensitive EDXRF measurements in the industry.

EASY INSTRUMENT CONTROL WITH ADVANCED QUALITATIVE AND QUANTITATIVE ANALYTICAL SOFTWARE

NEX CG II is easy to use with QuantEZ®, a powerful PC-based software providing intuitive instrument control with simple menu navigation and a customizable EZ Analysis interface. Users can maximize their time and productivity with simplified routine operations and create their own methods using a simple flow bar wizard.

Advanced qualitative and quantitative analysis is powered by Rigaku’s RPF-SQX Fundamental Parameters (FP) software, featuring Rigaku Profile Fitting (RPF) technology and Scattering FP. This robust integrated software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards. Rigaku’s Scattering FP method automatically estimates the concentration of unmeasurable low atomic number elements (H to F) and provides appropriate corrections. 

Calibration standards can be expensive and difficult to obtain for many applications. With RPF-SQX, the number of required standards is greatly reduced, significantly lowering the cost of ownership and reducing workload requirements for running routine analyses.

Features

• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Quick elemental analyses of solids, liquids, powders, coatings, and thin films
• Indirect excitation for exceptionally low detection limits
• High-power 50 kV 50 W X-ray tube
• Large-area high-throughput silicon drift detector (SDD)
• Analysis in air, helium, or vacuum
• Powerful and easy-to-use QuantEZ^® software with a multilingual user interface
• Advanced RPF-SQX Fundamentals Parameters software featuring Scattering FP
• Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
• Various automatic sample changers accommodating up to 52 mm samples
• Low cost of ownership

APPLICATION NOTES

Analysis of Cement and ASTM C114 Qualification
Analysis of ULSD
EPA Tier 3 Gasoline
Mn in Gasoline by ASTM D5059 Part D
Organic Chlorides in Crude by ASTM D4929 Part C
Pb in Gasoline by ASTM D5059 Part C & A
Additive Elements in Lubricating Oils per ASTM D7751
Agricultural Soils & Plant Materials
Alloy Powders for 3D Printing
Analysis of Air Filters - U.S. EPA Sensitivity
Analysis of Animal Feeds
Analysis of Coal by the FP Method
Analysis of Coal Fly Ash
Analysis of Fiberglass
Analysis of Gemstones
Analysis of Glass & Raw Materials
Analysis of heavy metals in aerosols on air filters
Analysis of Lead / Zinc Ore
  Category by Benchtop EDXRF

Rigaku NEX DE VS - Benchtop EDXRF
A high-performance small (variable) spot benchtop EDXRF elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with an easy-to-learn Windows®-based QuantEZ software. Small spot analysis, from sodium (Na) through uranium (U), of almost any matrix - from solids, thin films and alloys to powders, liquids and slurries.
 

XRF elemental analysis in the field, plant or lab

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease of use of the NEX DE adds to its broad appeal for an ever-expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high-performance choice for routine elemental analysis by XRF.
 

XRF with 60 kV X-ray tube and SDD detector

The 60 kV X-ray tube and Peltier-cooled FAST SDD^® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

XRF options: autosampler, vacuum, helium and standardless FP

Options include fundamental parameters, a variety of automatic sample changers, a sample spinner and a helium purge or vacuum atmosphere for enhanced light element sensitivity. *FAST SDD^® is a registered trademark of Amptek, Inc.

Features

• Analyze Na to U non-destructively
• 1, 3 and 10 mm spot sizes, software selectable
• High-resolution imaging for accurate sample positioning
• Powerful QuantEZ Windows^®-based software
• Solids, liquids, alloys, powders and thin films
• 60 kV X-ray tube for wide elemental coverage
• FAST SDD^® detector for superior counting statistics
• Multiple automated tube filters for enhanced sensitivity
• Unmatched performance-to-price ratio
• Optional RPF-SQX fundamental parameters software
• Optional standardless fundamental parameters software

APPLICATION NOTES

The following application notes are relevant to this product

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Air Filter Detection Limits
Analysis of Alloy Powders for Metal 3D Printing
Electroless Nickel plating
Industrial Forensics
Lead in lead-free solder
Material Identification
Ni:Fe Metallurgy
Palladium Catalyst in Pharmaceuticals
RoHS: Cr, Hg, Pb, Br and Cd in polyethylene
  Category by Benchtop EDXRF

Rigaku NEX LS Scanning Coating Analyzer

Designed explicitly to meet the needs of challenging conditions found in coating and converting processes, NEX LS helps maintain routine quality control for web and coil applications. The NEX LS linear scanner provides real-time coat weight profiling of your process. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, conversion coatings, fuel cell loadings, metalized plastic, top coatings on the metal coil, and fire retardants on fabric.
 

Featuring advanced third-generation energy dispersive X-ray fluorescence (EDXRF) technology, NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.

• In-line, real-time coat weight profiling
• Measure elements aluminium (AI) to uranium (U)
• Robust Rigaku NEX Series optical kernel
• Industrial touchscreen user interface

Energy Dispersive X-ray Fluorescence (EDXRF)

To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With their proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminium (Al) through uranium (U).

Coating Thickness and Composition

Rigaku NEX LS is specifically designed to service web and coil applications, with the ability to perform multi-element composition, coat weight or coating thickness. The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Where needed, the elemental composition of a coating is measured directly. In contrast, coat weight (or coating thickness) may be measured directly (where the counting rate for an element is proportional to thickness) or indirectly by measuring the attenuation of some substrate element (where the counting rate is negatively correlated to thickness).

Silicone Release Coatings

Benchtop EDXRF spectrometers have long been a familiar technology for release coatings, converters, vacuum-formed plastics manufacturers and other industries using silicone oils as barrier layers, release coatings or denesting agents. Real-time scanning, for tighter process control tolerances, takes EDXRF technology for silicone coatings analysis to the next level. Silicone coatings are applied to plastic and paper substrates to modify the release characteristics of a product (like labels) or packaging. If too little silicone is applied or if there are areas of the web where the silicone coating is missing, the adhesive release properties will be adversely affected in release applications or the denesting characteristics of the vacuum-formed plastic will be compromised causing product rejection or disruption in manufacturing and other downstream processes. If too much silicone is applied, the cost of the manufactured roll increases, reducing profitability and in some cases impacting the acceptance and performance of the end product.

Category by Benchtop EDXRF

Rigaku NEX OL

Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, NEX OL represents the next evolution of process elemental analysis for liquid stream applications. Designed to span from heavy industrial through to food-grade process gauging solutions, the NEX OL is configurable for use in both classified and non-classified areas.

• Real-time process control by elemental analysis
• Measure elements of aluminium to uranium
• From ppm levels to weight percent (wt%)
• Robust NEX QC+ optics with SDD detector
• Industrial touchscreen user interface
• Easy empirical calibration and routine operation
• Toolless routine maintenance
• Multiple remote analysis heads (non-classified)
• No dangerous radioisotopes

Rigaku NEX XT - High Level Sulfur Measurement

NEX XT is the next generation process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.

• Measure sulfur (S) from 200 ppm to 6 wt%
• Compact design with no routine maintenance
• Up to 1450 psig and 200°C
• User-adjustable data update frequency
• Reduced standards requirements
• No sample condition or recovery system
• No radioisotopes

Category by Benchtop EDXRF